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Why it’s tough to characterize SiC power MOSFETs.
Download the Application Note, which covers the Littelfuse Dynamic Characterization Platform. The Dynamic Characterization Platform from Littelfuse is designed to:
- Measure MOSFET switching losses, switching times, and gate charge accurately
- Measure Barrier Diode (SBD) and body diode reverse recovery accurately
- Provide an informed reference design for gate drive and power loop PCB layout
- Provide informed recommendations for gate drive layout and components
- Promote streamlined device validation and quicker design cycles
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