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Why it’s tough to characterize SiC power MOSFETs. 

Download the Application Note, which covers the Littelfuse Dynamic Characterization Platform. The Dynamic Characterization Platform from Littelfuse is designed to:

  • Measure MOSFET switching losses, switching times, and gate charge accurately
  • Measure Barrier Diode (SBD) and body diode reverse recovery accurately
  • Provide an informed reference design for gate drive and power loop PCB layout
  • Provide informed recommendations for gate drive layout and components
  • Promote streamlined device validation and quicker design cycles

dcp app note

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