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Why it’s tough to characterize SiC power MOSFETs. 

Download the Application Note, which covers the Littelfuse Dynamic Characterization Platform. The Dynamic Characterization Platform from Littelfuse is designed to:

• Measure MOSFET switching losses, switching times, and gate charge accurately
• Measure Barrier Diode (SBD) and body diode reverse recovery accurately
• Provide an informed reference design for gate drive and power loop PCB layout
• Provide informed recommendations for gate drive layout and components
• Promote streamlined device validation and quicker design cycles

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